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Black phosphorus (BP) has been recently rediscovered as an elemental two-dimensional (2D) material that shows promising results for next generation electronics and optoelectronics because of its intrinsically superior carrier mobility and small direct band gap. In various 2D field-effect transistors (FETs), the choice of metal contacts is vital to the device performance, and it is a major challenge to reach ultralow contact resistances for highly scaled 2D FETs. Here, we experimentally show the effect of a work function tunable metal contact on the device performance of BP FETs. Using palladium (Pd) as the contact material, we employed the reaction between Pd and H2 to form a Pd-H alloy that effectively increased the work function of Pd and reduced the Schottky barrier height (ΦB) in a BP FET. When the Pd-contacted BP FET was exposed to 5

作者:Yuqiang, Ma;Chenfei, Shen;Anyi, Zhang;Liang, Chen;Yihang, Liu;Jihan, Chen;Qingzhou, Liu;Zhen, Li;Moh R, Amer;Tom, Nilges;Ahmad N, Abbas;Chongwu, Zhou

来源:ACS nano 2017 年 11卷 7期

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作者:
Yuqiang, Ma;Chenfei, Shen;Anyi, Zhang;Liang, Chen;Yihang, Liu;Jihan, Chen;Qingzhou, Liu;Zhen, Li;Moh R, Amer;Tom, Nilges;Ahmad N, Abbas;Chongwu, Zhou
来源:
ACS nano 2017 年 11卷 7期
标签:
black phosphorus contact resistance field-effect transistor layered material phosphorene two-dimensional materials
Black phosphorus (BP) has been recently rediscovered as an elemental two-dimensional (2D) material that shows promising results for next generation electronics and optoelectronics because of its intrinsically superior carrier mobility and small direct band gap. In various 2D field-effect transistors (FETs), the choice of metal contacts is vital to the device performance, and it is a major challenge to reach ultralow contact resistances for highly scaled 2D FETs. Here, we experimentally show the effect of a work function tunable metal contact on the device performance of BP FETs. Using palladium (Pd) as the contact material, we employed the reaction between Pd and H2 to form a Pd-H alloy that effectively increased the work function of Pd and reduced the Schottky barrier height (ΦB) in a BP FET. When the Pd-contacted BP FET was exposed to 5